Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscope

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Angstrom Advanced Inc. OS-AA Opening Multi-function Scanning Probe Microscope

Introduction
Angstrom Advanced OS-AA (SPM) system is known for its multi-functionality and full openness. OS-AA system is not just a platform for unconventional experiments but also for further developments.

Features
  • Multi-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase Imaging with Full digital control 16bit ADC/DAC
  • High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange
  • Input/output signal channel preserved for further system extension
  • Standard external open interface for second developments
  • I-V Curve and Force-Curve
  • Nano-Processing
  • Nano-manipulating with Super-Multimedia technology
  • Designed for Windows Vista/XP/NT/2000/9X
  • Hardcode and Dynamic Code both applied to offline software
  • Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness
Specifications
Resolution: AFM: 0.26nm lateral, 0.1nm vertical
STM: 0.13nm lateral, 0.01nm vertical
Current Sensitivity: ≤10pA
Force Sensitivity: ≤ 1nN
Positioning Accuracy: ≤ 0.5nm
Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC)
Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier)
DI/DO channels preserved: 8ch DI, 8ch DO
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