AFM / SPM

 a

Angstrom Advanced AA2000 Atomic Force Microscope (AFM)

Angstrom Advanced Combined Atomic Force Microscope(AFM) and Lateral Force Microscope(LFM)

 v

Angstrom Advanced AA3000 Scanning Probe Microscope(SPM)

Angstrom Advanced Combined Scanning Force Microscope(SPM), Atomic Force microscope(AFM) and Lateral ForceMicroscope(LFM)

 

Angstrom Advanced AA5000 Multi-function Scanning Probe Microscope(SPM) Systems

Full range of Angstrom Advanced STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing

 d

Angstrom Advanced OS-AA Opening Multi-function Scanning Probe Microscope(SPM)

Full range of Angstrom Advanced STM, AFM, LFM, MFM, EFM Full openness for further developments

 

Angstrom Advanced AA8000 Multi-function Scanning Electron System(SEM)

Angstrom Advanced AA8000 combines high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment

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