Angstrom Advanced AA2000 High Performance Multi-Functional Atomic Force Microscope



High Performance 

·         Atomic-scale of resolution

·         Large sample size

·         DSP(Digital Signal Processing) for great performance

·         Real time operating system embedded

·         Fast Ethernet connection with computer


·         Atomic Force Microscope (AFM)

·         Lateral Force Microscope (LFM)

·         Force Analysis: I-V Curve, I-Z Curve, Force Curve

·         Online real-time 3D image for better observation

·         Multi-channel signals for more sample details

·         Trace-Retrace scan, Back-Forward scan

·         Multi-Analysis: Granularity and Roughness

·         Data load-out for further analysis

Easy Operation

·         Fast automatically tip-engaging

·         Easy change of the tip holder, for simple switching between STM and AFM

·         Full digital control, auto system status recognition

·         Software-based sample movement

·         Nano-Movie function: Continuous data collection, storage and replay

·         Modularized design for convenient maintenance and future upgrades

Technical parameter
Working Pressure
Working Pressure
Voltage of Power Supply
VAC 220V±10%; 50HZ±5%
VAC 110V±10%; 60HZ±5%
Environment Temperature
0-40℃ Relative Humidity≤85%
Environment Condition
Without large quantity of dust and caustic gas
Maximum Power

One Response to “Angstrom Advanced AA2000 High Performance Multi-Functional Atomic Force Microscope”

  1. Angstrom Advanced Says:

    The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is a silicon or silicon nitride with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke’s law. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces, Casimir forces, solvation forces, etc. Along with force, additional quantities may simultaneously be measured through the use of specialized types of probe. Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capacitive sensing or piezoresistive AFM cantilevers. These cantilevers are fabricated with piezoresistive elements that act as a strain gauge. Using a Wheatstone bridge, strain in the AFM cantilever due to deflection can be measured, but this method is not as sensitive as laser deflection or interferometry.

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